Yin, H., Hutter, M., Wagner, C., Tautz, F.S., Bocquet, F.C., & Kumpf, C. (2024). Epitaxial growth of mono- and (twisted) multilayer graphene on SiC(0001). arXiv preprint arXiv:2411.11684v1.
This study investigates the impact of annealing temperature on the morphology and layer homogeneity of graphene grown epitaxially on SiC(0001) substrates using borazine as a surfactant.
The researchers employed a combination of surface characterization techniques, including low-energy electron microscopy (LEEM), angle-resolved photoelectron spectroscopy (ARPES), and low-energy electron diffraction (LEED), to analyze the electronic structure, morphology, and layer stacking of the grown graphene. A novel, automated LEEM-IV data analysis method based on the K-means clustering algorithm was developed to identify regions with different numbers of graphene layers.
This research provides valuable insights into the influence of growth parameters on the formation of tBLG on SiC substrates, a crucial step towards the controlled fabrication of tBLG-based devices for various applications.
The study primarily focuses on the morphological and structural characterization of the grown graphene. Further investigations into the electronic properties of the tBLG patches, including their twist angle distribution and potential for exhibiting exotic phenomena, are warranted. Exploring alternative decoupling strategies to achieve large-area, homogeneous tBLG on SiC remains an important avenue for future research.
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