Xiao, H. B., Chen, C., Sui, X., Zhang, S. H., Sun, M. Z., Gao, H., Jiang, Q., Li, Q., Yang, L. X., Ye, M., Zhu, F. Y., Wang, M. X., Liu, J. P., Zhang, Z. B., Wang, Z. J., Chen, Y. L., Liu, K. H., & Liu, Z. K. (Year). Thickness-dependent Topological Phases and Flat Bands in Rhombohedral Multilayer Graphene.
This study investigates the layer-dependent evolution of the electronic structure in rhombohedral multilayer graphene (RMG) from few-layer samples to the bulk limit, aiming to understand the interplay between electron correlations, topological phases, and the emergence of exotic quantum states.
The researchers employed spatially resolved angle-resolved photoemission spectroscopy (NanoARPES) to probe the electronic structure of RMG with varying layer numbers (N = 3, 24, and 48). Density functional theory (DFT) calculations were performed to support and interpret the experimental findings.
The study provides direct experimental evidence for a thickness-driven topological phase transition in RMG, transitioning from a 3D generalization of the SSH model to a topological DNSS as the layer number increases. The observed evolution of the electronic structure and the presence of flat bands highlight the potential of RMG as a platform for exploring the interplay between strong correlations and topological physics.
This research significantly contributes to the understanding of the electronic properties of RMG and its potential for hosting exotic quantum phases. The findings have implications for the development of novel electronic devices based on topological materials.
Further investigations are needed to explore the correlation effects in RMG and their influence on the observed topological phases. Additionally, studying the effects of external stimuli, such as electric fields and strain, on the electronic structure of RMG would be of interest.
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by H. B. Xiao, ... om arxiv.org 11-19-2024
https://arxiv.org/pdf/2411.11359.pdfDiepere vragen