The paper focuses on constructing efficient and powerful sequential tests and confidence sequences for the mean of a Gaussian distribution with unknown variance.
Key highlights:
The authors apply the method of "Universal Inference" to derive e-processes and confidence sequences for both the point null (μ = μ0) and one-sided composite null (μ ≤ μ0) hypotheses. These provide anytime-valid error control and optimal asymptotic performance.
The authors revisit Lai's [1976] seminal work on sequential t-tests, filling in missing details and showing why his approach yields a confidence sequence without an e-process. They then introduce a simple variant that provides closed-form e-processes with improved tightness.
The authors derive information-theoretic lower bounds on the width of confidence intervals and upper bounds on the growth of e-processes for the t-test problem. They show that their new methods (from contributions 1 and 3) attain or nearly attain these optimal rates, while other existing conservative t-tests, and even the classical fixed-sample t-test, fail to be optimal.
The paper provides a comprehensive treatment of sequential t-tests, connecting them to group-invariant tests, likelihood ratio martingales, and universal inference, leading to a deeper understanding of the problem.
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