Shen, Y., Zhang, D., Zhang, Z., Fu, L., & Ye, Q. (2024). Synthetic Instance Segmentation from Semantic Image Segmentation Masks. arXiv preprint arXiv:2308.00949v4.
This paper proposes a novel method, called Synthetic Instance Segmentation (SISeg), to address the challenge of expensive instance-level annotations in instance segmentation tasks. The research aims to achieve accurate instance segmentation by leveraging readily available semantic segmentation models and pixel-level annotations.
SISeg employs a two-step framework. First, it utilizes a pre-trained semantic segmentation model to obtain semantic masks from input images. Then, it employs two parallel branches: a Displacement Field Detection Module (DFM) to differentiate instances within the same class by predicting displacement field vectors and a Class Boundary Refinement module (CBR) to refine object boundaries by learning semantic similarity between pixels. These branches work together to generate instance segmentation results from the semantic masks.
The study demonstrates that SISeg offers an efficient and effective approach for instance segmentation by leveraging existing semantic segmentation models and pixel-level annotations. The proposed method eliminates the need for costly instance-level annotations while achieving competitive accuracy, making it a promising solution for various applications.
This research significantly contributes to the field of computer vision by presenting a novel and efficient approach for instance segmentation. The proposed SISeg method addresses the bottleneck of expensive instance-level annotations, paving the way for more accessible and cost-effective object recognition in various domains.
The study primarily focuses on two datasets, and further evaluation on more diverse datasets is recommended. Additionally, exploring the integration of other weakly-supervised techniques with SISeg could further enhance its performance and applicability.
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by Yuchen Shen,... ที่ arxiv.org 10-10-2024
https://arxiv.org/pdf/2308.00949.pdfสอบถามเพิ่มเติม