核心概念
通過對超表面元素進行邊角切割,可以調整其在圓偏振光照射下的近場淨電通量,從而實現對圓偏振光方向的差異化比色感測。
統計資料
奈米粒子的高度固定為 270 奈米。
奈米粒子之間的間隙保持在 100 奈米。
測試的形狀包括方形、長方形和 L 形。
所有結構的縱橫比固定為 1:1.00、1:1.25、1:1.50、1:1.75 和 1:2.00。
四分之一切割表示切割角的長度或寬度是形狀總長度或寬度的四分之一。
對於每個修飾,不同縱橫比的奈米粒子的體積保持不變。
四分之二切割結構在兩種圓偏振光照射下表現出最大的顏色差異。
引述
"By designing metasurface elements such that the electric field lines of one polarization disperse along the in-plane axes and those of the other polarization scatter along the out-of-plane axis, it may be possible to maximize this differentiation within the studied design space."
"Our findings are currently correlative, and further study is required to assess the strength of this correlation."
"In summary, this study presents a methodology to simplify the differentiation of CPL orientations from a two-peak to a single-peak problem and hypothesizes a correlation between net electric flux and far-field observations."