This research note presents a novel method for determining the accuracy of quantum error correction decoders used in surface code quantum memories. The author focuses on the logical error rate, a crucial metric for evaluating decoder performance.
The traditional method involves simulating numerous memory experiments with varying durations and fitting a curve to the experiment failure probabilities. This approach, while effective, requires significant computational resources.
The proposed new method offers a more streamlined approach. It directly calculates the logical error rate by tracking anyon pairs – endpoints of paths representing bit-flip errors – within the decoder's graph representation of the quantum state. By sweeping through the graph layer by layer, the method identifies logical bitflips as anyon pairs spanning opposite boundaries.
This direct counting method eliminates the need for multiple simulations and curve fitting, significantly reducing computational overhead. The author provides a detailed algorithm for implementing this method and suggests a sufficient duration for the emulated memory experiment to ensure accurate results.
The note highlights the efficiency and simplicity of the new method, emphasizing its potential to accelerate the benchmarking of surface code decoders. This advancement is particularly relevant as research progresses towards building larger, fault-tolerant quantum computers, where accurate and efficient error correction is paramount.
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